SN74ABTH182652APM

Mfr. #:: SN74ABTH182652APM
描述:: Specialty Function Logic Device w/18-Bit Trnscvr & Register
生命週期:: 製造商新產品
數據表:: SN74ABTH182652APM 數據表
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更多信息:: SN74ABTH182652APM 更多信息 SN74ABTH182652APM Product Details

產品屬性
屬性值

製造商：: 德州儀器

產品分類：: 專業功能邏輯

RoHS：: Y

產品：: 邊界掃描 JTAG 邏輯

系列：: SN74ABTH182652A

最低工作溫度：: - 40 C

最高工作溫度：: + 85 C

包裝/案例：: LQFP-64

打包：: 托盤

工作溫度範圍：: - 40 C to + 85 C

品牌：: 德州儀器

安裝方式：: 貼片/貼片

濕氣敏感：: 是的

產品類別：: 專業功能邏輯

出廠包裝數量：: 160

子類別：: 邏輯 IC

商品名：: 範圍

單位重量：: 0.012088 oz

Tags: SN74ABTH1826, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7

Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74ABTH182652APM 評級和評論

N***n

Good inexpensive settlement!

2019-07-12

E**y

Perfect

2019-07-09

E**d

Capacitors good i will still order, came for a month the track was not tracked

2019-05-16

SN74ABTH182652APM 描述

*** Stop Electro: Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64

***as Instruments: Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85

***ark: Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes

***ASIN: The 'ABTH18652A and 'ABTH182652A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

***: In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.

***: Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow, but uses CLKBA, SBA, and inputs. Since the input is active-low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 illustrates the four fundamental bus-management functions that are performed with the 'ABTH18652A and 'ABTH182652A.

***AS INS

***TEXAS: In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.

***AS USD: Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

***AS INSTRUM: Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction is also included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.

***: Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.

***AS INSTRUMENTS INC: The B-port outputs of 'ABTH182652A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.

***XS: The SN54ABTH18652A and SN54ABTH182652A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18652A and SN74ABTH182652A are characterized for operation from -40°C to 85°C.

***AS INSTUMENTS

***as Instr.

SN74ABTH182652APM 更多信息

Logic Solutions: OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More

Market price

型號	描述	庫存	價格
SN74ABTH182652APM DISTI # SN74ABTH182652APM-ND	IC SCAN TEST DEVICE 18BIT 64LQFP RoHS: Compliant Min Qty: 160 Container: Tray	Temporarily Out of Stock	160:$15.8931
SN74ABTH182652APM DISTI # SN74ABTH182652APM	Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182652APM) RoHS: Compliant Min Qty: 160 Container: Tray	Americas - 0	160:$17.3900 320:$16.9900 640:$16.2900 960:$15.8900 1600:$15.5900
SN74ABTH182652APM DISTI # SN74ABTH182652APM	Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH182652APM) RoHS: Compliant Min Qty: 1 Container: Tray	Europe - 0	1:€16.5900 10:€15.6900 25:€14.9900 50:€14.2900 100:€13.5900 500:€13.0900 1000:€12.4900
SN74ABTH182652APM DISTI # 595-SN74ABTH182652AP	Specialty Function Logic Device w/18-Bit Trnscvr & Register RoHS: Compliant	0	1:$20.1800 5:$19.3500 10:$18.6200 25:$17.7800 100:$15.9000 250:$15.1700 500:$14.4300
SN74ABTH182652APM	Boundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64 RoHS: Compliant	2400	1000:$13.7600 500:$14.4900 100:$15.0800 25:$15.7300 1:$16.9400

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