SN74ABTH18504APM

SN74ABTH18504APM
Mfr. #:
SN74ABTH18504APM
描述:
Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
生命週期:
製造商新產品
數據表:
SN74ABTH18504APM 數據表
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ECAD Model:
更多信息:
SN74ABTH18504APM 更多信息 SN74ABTH18504APM Product Details
產品屬性
屬性值
製造商:
德州儀器
產品分類:
專業功能邏輯
RoHS:
Y
系列:
SN74ABTH18504A
工作電源電壓:
5 V
最低工作溫度:
- 40 C
最高工作溫度:
+ 85 C
包裝/案例:
LQFP-64
打包:
托盤
功能:
帶有通用總線收發器的掃描測試設備
電路數量:
1
工作溫度範圍:
- 40 C to + 85 C
品牌:
德州儀器
安裝方式:
貼片/貼片
濕氣敏感:
是的
產品類別:
專業功能邏輯
傳播延遲時間:
5 ns
出廠包裝數量:
160
子類別:
邏輯 IC
商品名:
範圍
單位重量:
0.012088 oz
Tags
SN74ABTH18504, SN74ABTH185, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    A***v
    A***v
    RU

    Norm, came quickly, threw in a box

    2019-03-03
    E**p
    E**p
    IL

    Good quality. Item arrived on time.

    2019-03-11
    S***z
    S***z
    ZA

    As advertised

    2019-03-06
    S***e
    S***e
    KR

    good

    2019-03-18
***as Instruments
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
***p One Stop Global
Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray
***i-Key
IC SCAN TEST UNIV TXRX 64LQFP
***ical
Scan Test Device
***ark
Specialty Logic IC; Logic Family:ABT; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Package/Case:64-LQFP; No. of Pins:64; Operating Temperature Range:-40°C to +85°C; Input Type:TTL; Leaded Process Compatible:Yes ;RoHS Compliant: Yes
***AS INS
The 'ABTH18504A and 'ABTH182504A scan test devices with 20-bit universal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSRUMENTS
In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM universal bus transceivers.
***as Instruments Inc.
Data flow in each direction is controlled by output-enable ( and ), latch-enable (LEAB and LEBA), clock-enable ( and ), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A-bus data is latched while is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and is low, A-bus data is stored on a low-to-high transition of CLKAB. When is low, the B outputs are active. When is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the , LEBA, , and CLKBA inputs.
***as Instruments Inc.
In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS INSTRUMENTS INCORPORATED
 
***ASI
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***AS INSTRUMENTS INCORPORATED
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INSTRUMENTS INCORPORATED
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***AS INS
The B-port outputs of 'ABTH182504A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***AS INSRUMENTS
The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for operation from -40°C to 85°C.
***XS
 
***AS INSTUMENTS
 
***AS USD
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, CLKENBA\, and CLKBA.
***AS USD
Output level before the indicated steady-state input conditions were established
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
型號 描述 庫存 價格
SN74ABTH18504APM
DISTI # 29450248
Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant
480
  • 160:$17.4300
SN74ABTH18504APM
DISTI # 296-4135-ND
IC SCAN TEST UNIV TXRX 64LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray
307In Stock
  • 640:$13.9606
  • 160:$15.6936
  • 25:$17.8120
  • 10:$18.5820
  • 1:$20.2200
SN74ABTH18504APMR
DISTI # SN74ABTH18504APMR-ND
IC SCAN TEST UNIV TXRX 64LQFP
RoHS: Compliant
Min Qty: 1000
Container: Tape & Reel (TR)
Limited Supply - Call
    SN74ABTH18504APM
    DISTI # SN74ABTH18504APM
    Bus XCVR Single 20-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH18504APM)
    RoHS: Compliant
    Min Qty: 160
    Container: Tray
    Americas - 0
    • 160:$15.9900
    • 320:$15.5900
    • 640:$14.9900
    • 960:$14.5900
    • 1600:$14.3900
    SN74ABTH18504APMScan Test Devices With 20-Bit Universal Bus Transceivers3520
    • 1000:$10.9400
    • 750:$10.9800
    • 500:$12.2300
    • 250:$13.2900
    • 100:$13.9600
    • 25:$15.9800
    • 10:$16.5600
    • 1:$17.8100
    SN74ABTH18504APMBoundary Scan Reg Bus Transceiver, ABT Series, 1-Func, 20-Bit, True Output, BICMOS, PQFP64
    RoHS: Compliant
    25152
    • 1000:$12.6700
    • 500:$13.3400
    • 100:$13.8900
    • 25:$14.4800
    • 1:$15.6000
    SN74ABTH18504APM
    DISTI # 595-SN74ABTH18504APM
    Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
    RoHS: Compliant
    184
    • 1:$20.2200
    • 10:$18.5900
    • 25:$17.6200
    • 100:$15.7000
    • 250:$14.9300
    • 500:$13.9700
    SN74ABTH18504APMR
    DISTI # 595-SN74ABTH18504AMR
    Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
    RoHS: Compliant
    0
      SN74ABTH18504APMG4
      DISTI # 595-SN74ABTH18504AG4
      Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
      RoHS: Compliant
      0
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        Latches 12-24B Multiplexed D-Type
        可用性
        庫存:
        Available
        訂購:
        3500
        輸入數量:
        SN74ABTH18504APM的當前價格僅供參考,如果您想獲得最優惠的價格,請提交查詢或直接發送電子郵件至我們的銷售團隊[email protected]
        參考價格(美元)
        數量
        單價
        小計金額
        1
        US$20.22
        US$20.22
        10
        US$18.59
        US$185.90
        25
        US$17.62
        US$440.50
        100
        US$15.70
        US$1 570.00
        250
        US$14.93
        US$3 732.50
        500
        US$13.97
        US$6 985.00
        由於2021年半導體供不應求,低於2021年之前的正常價格,請發詢價確認。
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