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SN74ABTH182646APM

SN74ABTH182646APM
Mfr. #:
SN74ABTH182646APM
描述:
Specialty Function Logic Device w/18-Bit Trnscvr & Register
生命週期:
製造商新產品
數據表:
SN74ABTH182646APM 數據表
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更多信息:
SN74ABTH182646APM 更多信息 SN74ABTH182646APM Product Details
產品屬性
屬性值
製造商：
德州儀器
產品分類：
專業功能邏輯
RoHS：
Y
系列：
SN74ABTH182646A
工作電源電壓：
5 V
最低工作溫度：
- 40 C
最高工作溫度：
+ 85 C
包裝/案例：
LQFP-64
打包：
托盤
功能：
帶有總線收發器/寄存器的掃描測試設備
電路數量：
2
工作溫度範圍：
- 40 C to + 85 C
品牌：
德州儀器
安裝方式：
貼片/貼片
濕氣敏感：
是的
產品類別：
專業功能邏輯
傳播延遲時間：
7 ns
出廠包裝數量：
160
子類別：
邏輯 IC
商品名：
範圍
單位重量：
0.012088 oz
Tags
SN74ABTH1826, SN74ABTH182, SN74ABTH18, SN74ABTH1, SN74ABTH, SN74AB, SN74A, SN74, SN7
Service Guarantees

We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
Our experienced sales team and tech support team back our services to satisfy all our customers.

we buy and manage excess electronic components, including excess inventory identified for disposal.
Email us if you have excess stock to sell.

Email: [email protected]

Step1: Vacuum Packaging with PL
Step1:
Vacuum Packaging with PL
Step2: Anti-Static Bag
Step2:
Anti-Static Bag
Step3: Packaging Boxes
Step3:
Packaging Boxes
    A***k
    A***k
    PL

    all ok.

    2019-04-20
    D***v
    D***v
    RU

    Cool thing for this money

    2019-02-05
    A***v
    A***v
    US

    Order received in excellent condition, packed well. Corresponds to the description. Thank you very much to the seller! Five stars. I recommend. Order received in excellent condition, packed well. Fits the description. Thank you very much to the seller! Five stars. Recommend.

    2019-05-14
***as Instruments
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
***ical
Scan Test Device -40C to 85C 64-Pin LQFP Tray
***et
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
***INS
The 'ABTH18646A and 'ABTH182646A scan test devices with 18-bit bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
***AS INSRUMENTS
In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed transmission of data directly from the input bus or from the internal registers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM bus transceivers and registers.
***as Instruments Inc.
Transceiver function is controlled by output-enable () and direction (DIR) inputs. When is low, the transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR is low. When is high, both the A and B outputs are in the high-impedance state, effectively isolating both buses.
***AS INSTUMENTS
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that are performed with the 'ABTH18646A and 'ABTH182646A.
***AS INSTRU
 
***
In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
***AS INSTR
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
***
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count addressing scheme is useful.
***AS INST
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
***AS INSTRU
The B-port outputs of 'ABTH182646A, which are designed to source or sink up to 12 mA, include 25- series resistors to reduce overshoot and undershoot.
***XS
The SN54ABTH18646A and SN54ABTH182646A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABTH18646A and SN74ABTH182646A are characterized for operation from -40°C to 85°C.
***ASI
 
***TEXAS
 
***as Instr.
The data-output functions can be enabled or disabled by various signals at and DIR. Data-input functions are always enabled; i.e., data at the bus pins is stored on every low-to-high transition of the clock inputs.
Logic Solutions
OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More
型號 描述 庫存 價格
SN74ABTH182646APM
DISTI # 29457866		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
RoHS: Compliant		640
  • 500:$13.2348
  • 160:$14.3038
SN74ABTH182646APM
DISTI # 296-4133-ND		IC SCAN-TEST-DEV/TXRX 64-LQFP
RoHS: Compliant
Min Qty: 1
Container: Tray		291In Stock
  • 640:$14.4293
  • 160:$15.8931
  • 25:$17.7752
  • 10:$18.6120
  • 1:$20.1800
SN74ABTH182646APM
DISTI # SN74ABTH182646APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray - Trays (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray		Americas - 0
  • 1:$19.4900
  • 10:$17.9900
  • 25:$17.1900
  • 50:$17.1900
  • 100:$15.5900
  • 500:$14.2900
  • 1000:$13.8900
SN74ABTH182646APM
DISTI # SN74ABTH182646APM		Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray (Alt: SN74ABTH182646APM)
RoHS: Compliant
Min Qty: 1
Container: Tray		Europe - 0
  • 1:€16.5900
  • 10:€15.6900
  • 25:€14.9900
  • 50:€14.2900
  • 100:€13.5900
  • 500:€13.0900
  • 1000:€12.4900
SN74ABTH182646APMScan Test Devices With 18-Bit Transceivers And Registers3520
  • 1000:$11.8800
  • 750:$11.9200
  • 500:$13.2800
  • 250:$14.4300
  • 100:$15.1600
  • 25:$17.3600
  • 10:$17.9800
  • 1:$19.3400
SN74ABTH182646APMBoundary Scan Reg Bus Transceiver, ABT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
RoHS: Compliant		2876
  • 1000:$13.7600
  • 500:$14.4900
  • 100:$15.0800
  • 25:$15.7300
  • 1:$16.9400
SN74ABTH182646APM
DISTI # 595-SN74ABTH182646AP		Specialty Function Logic Device w/18-Bit Trnscvr & Register
RoHS: Compliant		0
  • 160:$15.9000
  • 320:$15.1700
圖片 型號 描述
SN74ABTH16244DGGR

Mfr.#: SN74ABTH16244DGGR

OMO.#: OMO-SN74ABTH16244DGGR

 Buffers & Line Drivers Tri-State 16-Bit
SN74ABTH245N

Mfr.#: SN74ABTH245N

OMO.#: OMO-SN74ABTH245N

 Bus Transceivers Tri-State Octal Bus
SN74ABTH16245DL

Mfr.#: SN74ABTH16245DL

OMO.#: OMO-SN74ABTH16245DL

 Bus Transceivers Tri-State 16-Bit Bus
SN74ABTH182504APM

Mfr.#: SN74ABTH182504APM

OMO.#: OMO-SN74ABTH182504APM

 Specialty Function Logic Device w/20-Bit Univ Bus Transceiver
SN74ABTH32318PN

Mfr.#: SN74ABTH32318PN

OMO.#: OMO-SN74ABTH32318PN

 Universal Bus Functions 18-Bit Tri-Port Univ Bus Exchanger
SN74ABTH162245DGVRG4

Mfr.#: SN74ABTH162245DGVRG4

OMO.#: OMO-SN74ABTH162245DGVRG4-1190

 全新原裝
SN74ABTH16460DLG4

Mfr.#: SN74ABTH16460DLG4

OMO.#: OMO-SN74ABTH16460DLG4-1190

 Encoders, Decoders, Multiplexers & Demultiplexers 4/1 Mltplx/DeMltplx Trncvr W/3-St Otpt
SN74ABTH245PWRE4

Mfr.#: SN74ABTH245PWRE4

OMO.#: OMO-SN74ABTH245PWRE4-TEXAS-INSTRUMENTS

 Bus Transceivers Octal Bus Trnscvrs With 3-State Outputs
SN74ABTH16244DGGR

Mfr.#: SN74ABTH16244DGGR

OMO.#: OMO-SN74ABTH16244DGGR-TEXAS-INSTRUMENTS

 Buffers & Line Drivers Tri-State 16-Bit
SN74ABTH16260DLR

Mfr.#: SN74ABTH16260DLR

OMO.#: OMO-SN74ABTH16260DLR-TEXAS-INSTRUMENTS

 Latches D Type
可用性
庫存:
Available
訂購:
3000
輸入數量:
SN74ABTH182646APM的當前價格僅供參考，如果您想獲得最優惠的價格，請提交查詢或直接發送電子郵件至我們的銷售團隊[email protected]
參考價格（美元）
數量
單價
小計金額
160
US$15.90
US$2 544.00
320
US$15.17
US$4 854.40
640
US$14.43
US$9 235.20
由於2021年半導體供不應求，低於2021年之前的正常價格，請發詢價確認。
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