SN74LVT8980AIDWREP

Mfr. #:: SN74LVT8980AIDWREP
描述:: Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr
生命週期:: 製造商新產品
數據表:: SN74LVT8980AIDWREP 數據表
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更多信息:: SN74LVT8980AIDWREP 更多信息 SN74LVT8980AIDWREP Product Details

產品屬性
屬性值

製造商：: 德州儀器

產品分類：: 專業功能邏輯

RoHS：: Y

系列：: SN74LVT8980A-EP

最低工作溫度：: - 40 C

最高工作溫度：: + 85 C

包裝/案例：: SOIC-24

打包：: 捲軸

工作溫度範圍：: - 40 C to + 85 C

品牌：: 德州儀器

安裝方式：: 貼片/貼片

產品類別：: 專業功能邏輯

出廠包裝數量：: 2000

子類別：: 邏輯 IC

第 # 部分別名：: V62/03668-01XE

單位重量：: 0.022025 oz

Tags: SN74LVT8980A, SN74LVT8980, SN74LVT898, SN74LVT8, SN74LVT, SN74LV, SN74L, SN74, SN7

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We provide 90-360 days warranty.

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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74LVT8980AIDWREP 描述

***as Instruments: Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters 24-SOIC -40 to 85

***ical: Bus Controller Parallel/Serial Interface 24-Pin SOIC T/R

***ark: IC,Test/JTAG Support,LVT/ALVT-BICMOS,SOP,24PIN,PLASTIC

***i-Key: IC EMBEDDED TEST BUS CTRL 24SOIC

*** Stop Electro: Microprocessor Circuit, BICMOS, PDSO24

***et: EP - JTAG EMBEDDED TEST-BUS CONTROLLER

***i-Key Marketplace: SN74LVT8980A-EP ENHANCED PRODUCT

***AS INSTUMENTS: The SN74LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and configuration/maintenance facilities at board and system levels.

***INS: The eTBCs master all TAP signals required to support one 4- or 5-wire IEEE Std 1149.1 serial test bus: test clock (TCK), test mode select (TMS), test data input (TDI), test data output (TDO), and test reset (TRST)\. All such signals can be connected directly to the associated target IEEE Std 1149.1 devices without need for additional logic or buffering. However, as well as being directly connected, the TMS, TDI, and TDO signals can be connected to distant target IEEE Std 1149.1 devices via a pipeline, with a retiming delay of up to 15 TCK cycles; the eTBCs automatically handle all associated serial-data justification.

***AS INST: Conceptually, the eTBCs operate as simple 8-bit memory- or I/O-mapped peripherals to a microprocessor/microcontroller (host). High-level commands and parallel data are passed to/from the eTBCs via their generic host interface, which includes an 8-bit data bus (D7-D0) and a 3-bit address bus (A2-A0). Read/write select (R/W\) and strobe (STRB)\ signals are implemented so that the critical host-interface timing is independent of the CLKIN period. An asynchronous ready (RDY) indicator is provided to hold off, or insert wait states into, a host read/write cycle when the eTBCs cannot respond immediately to the requested read/write operation.

***TEXAS: High-level commands are issued by the host to cause the eTBCs to generate the TMS sequences necessary to move the test bus from any stable TAP-controller state to any other such stable state, to scan instruction or data through test registers in target devices, and/or to execute instructions in the Run-Test/Idle TAP state. A 32-bit counter can be programmed to allow a predetermined number of scan or execute cycles.

***AS INS: During scan operations, serial data that appears at the TDI input is transferred into a serial to 4 × 8-bit-parallel first-in/first-out (FIFO) read buffer, which can then be read by the host to obtain the return serial-data stream up to eight bits at a time. Serial data that is to be transmitted from the TDO output is written by the host, up to eight bits at a time, to a 4 × 8-bit-parallel to serial FIFO write buffer.

***OMO Electronic: In addition to such simple state-movement, scan, and run-test operations, the eTBCs support several additional commands that provide for input-only scans, output-only scans, recirculate scans (in which TDI is mirrored back to TDO), and a scan mode that generates the protocols used to support multidrop TAP configurations using TIs addressable scan port. Two loopback modes also are supported that allow the microprocessor/microcontroller host to monitor the TDO or TMS data streams output by the eTBCs.

***ASI: The eTBCs flexible clocking architecture allows the user to choose between free-running (in which the TCK always follows CLKIN) and gated modes (in which the TCK output is held static except during state-move, run-test, or scan cycles) as well as to divide down TCK from CLKIN. A discrete mode also is available in which the TAP is driven strictly by read/write cycles under full control of the microprocessor/microcontroller host. These features ensure that virtually any IEEE Std 1149.1 target device or device chain can be serviced by the eTBCs, even where such may not fully comply to IEEE Std 1149.1.

***AS INSTRUMENTS INCORPORATED: While most operations of the eTBCs are synchronous to CLKIN, a test-output enable (TOE)\ is provided for output control of the TAP outputs, and a reset (RST)\ input is provided for hardware reset of the eTBCs. The former can be used to disable the eTBCs so that an external controller can master the associated IEEE Std 1149.1 test bus.

SN74LVT8980AIDWREP 更多信息

Logic Solutions: OMO Electronic Logic Solutions offers a full spectrum of logic functions and technologies from the mature to the advanced, including bipolar, BiCMOS, and CMOS. TI's process technologies offer the logic performance and features required for modern logic designs, while maintaining support for more traditional logic products.Learn More

Market price

型號	描述	庫存	價格
SN74LVT8980AIDWREP DISTI # 296-22384-1-ND	IC EMBEDDED TEST BUS CTRL 24SOIC RoHS: Compliant Min Qty: 1 Container: Cut Tape (CT)	1711In Stock	1000:$8.9728 500:$9.7824 100:$10.9968 10:$13.0210 1:$14.1700
SN74LVT8980AIDWREP DISTI # 296-22384-6-ND	IC EMBEDDED TEST BUS CTRL 24SOIC RoHS: Compliant Min Qty: 1 Container: Digi-Reel®	1711In Stock	1000:$8.9728 500:$9.7824 100:$10.9968 10:$13.0210 1:$14.1700
SN74LVT8980AIDWREP DISTI # 296-22384-2-ND	IC EMBEDDED TEST BUS CTRL 24SOIC RoHS: Compliant Min Qty: 2000 Container: Tape & Reel (TR)	Temporarily Out of Stock	2000:$8.3840
SN74LVT8980AIDWREP DISTI # SN74LVT8980AIDWREP	Embedded Test Bus Controller 24-Pin SOIC T/R - Tape and Reel (Alt: SN74LVT8980AIDWREP) RoHS: Compliant Min Qty: 2000 Container: Reel	Americas - 0	2000:$9.4900 4000:$8.9900 8000:$8.6900 12000:$8.3900 20000:$8.1900
SN74LVT8980AIDWREP DISTI # SN74LVT8980AIDWREP	Embedded Test Bus Controller 24-Pin SOIC T/R (Alt: SN74LVT8980AIDWREP) RoHS: Compliant Min Qty: 2000 Container: Tape and Reel	Europe - 0	2000:€10.3900 4000:€9.3900 8000:€8.4900 12000:€8.1900 20000:€7.7900
SN74LVT8980AIDWREP	Enhanced Product Embedded Test-Bus Controllers Ieee Std 1149.1 (Jtag) Tap Masters	4000	1000:$7.4400 750:$7.4700 500:$8.3200 250:$9.0400 100:$9.5000 25:$10.8700 10:$11.2700 1:$12.1200
SN74LVT8980AIDWREP DISTI # 595-SN74L8980AIDWREP	Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr RoHS: Compliant	0	2000:$8.7200
V62/03668-01XE DISTI # 595-V62/03668-01XE	Specialty Function Logic Mil Enhance Embedded Test-Bus Cntrlr RoHS: Compliant	0
SN74LVT8980AIDWREP	Microprocessor Circuit, BICMOS, PDSO24 RoHS: Compliant	1765	1000:$8.6200 500:$9.0700 100:$9.4500 25:$9.8500 1:$10.6100

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