SN74ABT8652DLR

Mfr. #:: SN74ABT8652DLR
描述:: Specialty Function Logic Device w/Octal Bus Trnscvr & Register
生命週期:: 製造商新產品
數據表:: SN74ABT8652DLR 數據表
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更多信息:: SN74ABT8652DLR 更多信息 SN74ABT8652DLR Product Details

產品屬性
屬性值

製造商：: 德州儀器

產品分類：: 專業功能邏輯

RoHS：: Y

產品：: 邊界掃描 JTAG 邏輯

系列：: 74AB

工作電源電壓：: 4.5 V to 5.5 V

包裝/案例：: SSOP-28

打包：: 捲軸

品牌：: 德州儀器

安裝方式：: 貼片/貼片

產品類別：: 專業功能邏輯

出廠包裝數量：: 1

子類別：: 邏輯 IC

單位重量：: 0.025045 oz

Tags: SN74ABT8652DL, SN74ABT865, SN74ABT86, SN74ABT8, SN74AB, SN74A, SN74, SN7

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We guarantee 100% customer satisfaction.

Quality Guarantees

We provide 90-360 days warranty.

If the items you received were not in perfect quality, we would be responsible for your refund or replacement, but the items must be returned in their original condition.
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Step1:
Vacuum Packaging with PL

Step2:
Anti-Static Bag

Step3:
Packaging Boxes

SN74ABT8652DLR 描述

***i-Key: IC SCAN TEST DEVICE 28-SSOP

***as Instruments: The 'ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are functionally equivalent to the 'F652 and 'ABT652 octal bus transceivers and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers and registers. Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and output-enable (OEAB and ) inputs. For A-to-B data flow, data on the A bus is clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus (registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the high-impedance state. Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and inputs. Since the input is active low, the A outputs are active when is low and are in the high-impedance state when is high. Figure 1 shows the four fundamental bus-management functions that can be performed with the 'ABT8652. In the test mode, the normal operation of the SCOPETM bus transceivers and registers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations as described in IEEE Standard 1149.1-1990. Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. The SN54ABT8652 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8652 is characterized for operation from -40°C to 85°C.

Market price

型號	描述	庫存
SN74ABT8652DLR DISTI # SN74ABT8652DLR-ND	IC SCAN TEST DEVICE 28-SSOP RoHS: Compliant Min Qty: 1000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74ABT8652DLRG4 DISTI # SN74ABT8652DLRG4-ND	IC SCAN TEST DEVICE 28-SSOP RoHS: Compliant Min Qty: 1000 Container: Tape & Reel (TR)	Limited Supply - Call
SN74ABT8652DLR DISTI # 595-SN74ABT8652DLR	Specialty Function Logic Device w/Octal Bus Trnscvr & Register RoHS: Compliant	0
SN74ABT8652DLRG4 DISTI # 595-SN74ABT8652DLRG4	Specialty Function Logic Device w/Octal Bus Trnscvr & Register RoHS: Compliant	0

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